Technical Information Site of Power Supply Design
2020.05.27 Si Power Device
Up till now, the features and characteristics of MOSFETs have been explained. Specifications (data sheets) describe the electrical specifications ("specs") for MOSFETs and other components, and list parameter names as well as guaranteed values and the like. MOSFETs have many parameters, a number of which have already been considered in these articles; here they are listed in summary.
There are points to be noted. There may be some differences among manufacturers in the parameter names, terminology, and symbols. Moreover, there are some differences relating to condition settings and definitions. These differences must be dealt with by checking the measurement conditions and other matters described in the data sheet and understanding the specific details of each component.
● Absolute Maximum Ratings
Parameter | Symbol | Definition and Description |
---|---|---|
Drain-source voltage | VDSS | The maximum value of the voltage that can be applied across the drain and source with the gate and source put into a short-circuit state. |
Drain current (direct) | ID | The maximum value of the direct current that can flow continuously in the channel formed between the drain and source under specified conditions. |
Drain current (pulse) | IDP | The maximum value of the current that can flow in pulses in the channel formed between the drain and source, for a pulse width and duty ratio specified by the safe operating area. |
Gate-source voltage | VGS | The maximum value of the voltage that can be applied across the gate and source. |
Avalanche current (single pulse) | IAS | The maximum value of the drain current that is allowed during avalanche breakdown. |
Avalanche energy (single pulse) | EAS | The maximum value of the energy that is allowed during avalanche breakdown. |
Power dissipation | PD | The maximum value of the power dissipation allowed in the MOSFET under specified conditions. |
Junction temperature | Tj | The maximum value of the junction temperature that is allowed during component operation. |
Storage temperature | Tstg | The temperature range within which the device can be stored or transported without applying an electrical load to the component. |
● Thermal Resistance
Parameter | Symbol | Definition and Description |
---|---|---|
Thermal resistance (junction – case) | RthJC | The thermal resistance value from the device junction to the rear surface of the case. |
Thermal resistance (junction – ambient) | RthJA | The thermal resistance value from the device junction to the ambient environment. |
Soldering temperature (wave soldering) | Tsold | The maximum value of the solder melting temperature when mounting a MOSFET. |
● Electrical Characteristics
Parameter | Symbol | Definition and Description |
---|---|---|
Drain–source breakdown voltage | V(BR)DSS | In the state in which the gate and source are short-circuited, the voltage at which breakdown of the parasitic diode occurs and a current begins to flow between the drain and source. |
Drain–source breakdown voltage temperature coefficient | ⊿V(BR)DSS/⊿Tj | The temperature coefficient of the drain-source breakdown voltage. |
Zero gate voltage drain current | IDSS | The leakage current that flows between the drain and source when the gate and source are short-circuited under specified conditions. |
Gate leakage current | IGSS | The leakage current that flows between the gate and source when the drain and source are short-circuited under specified conditions. |
Gate threshold voltage | VGS(th) | The gate-source voltage at which a drain current begins to flow in the MOSFET. |
Gate threshold voltage temperature coefficient | ⊿VGS(th)/⊿Tj | The temperature characteristic of the gate threshold voltage. |
Drain–source ON resistance | RDS(on) | The value of the resistance between the drain and source when the MOSFET is turned on. |
Gate resistance | RG | The internal gate resistance value of the MOSFET. |
Forward transfer admittance | |Yfs| | The rate of change in the drain current with a 1 V change in the gate-source voltage. |
Input capacitance | Ciss | The value of the parasitic capacitance between the gate and source, measured in the state in which the drain and source are short-circuited for alternating currents. |
Output capacitance | Coss | The value of the parasitic capacitance between the drain and source, measured in the state in which the gate and source are short-circuited for alternating currents. |
Feedback capacitance | Crss | The value of the parasitic capacitance between the drain and gate, measured with the source pin grounded. |
Effective capacitance (referred to energy) | Co(er) | The fixed capacitance value equivalent to the Coss value resulting in the energy accumulated from when the drain-source voltage VDS is 0 V until VDS rises to 80% of the absolute maximum rating of the drain-source voltage. |
Effective capacitance (referred to time) | Co(tr) | The fixed capacitance value equivalent to the Coss value resulting in the charging time from when the drain-source voltage VDS is 0 V until VDS rises to 80% of the absolute maximum rating of the drain-source voltage. |
Turn-on delay time | td(on) | The time from when the gate-source voltage has risen to 10% of a voltage setting until the drain-source voltage has fallen to 90% of a set voltage. |
Rise time | tr | The time required for the drain-source voltage to fall from 90% to 10% of a voltage setting. |
Turn-off delay time | td(off) | The time from when the gate-source voltage has fallen to 90% of a voltage setting until the drain-source voltage has risen to 10% of a set voltage. |
Fall time | tf | The time required for the drain-source voltage to rise from 10% to 90% of a voltage setting. |
● Gate Charge Characteristics
Parameter | Symbol | Definition and Description |
---|---|---|
Total gate charge | Qg | The amount of gate charge necessary to raise the gate voltage of the MOSFET from 0 V to a specified voltage. |
Gate–source charge | Qgs | The amount of charge accumulated on the capacitance between the gate and source that is necessary to raise the gate voltage of the MOSFET from 0 V to the gate plateau voltage. |
Gate–drain charge | Qgd | The amount of charge accumulated on the capacitance between the gate and drain that is necessary for the MOSFET drain-source voltage VDS to fall from the power supply voltage to the ON voltage. |
Gate plateau voltage | V(plateau) | The value of the gate voltage at which mirror capacitance charge/discharge begins during switching. |
● Internal Diode Electrical Characteristics
Parameter | Symbol | Definition and Description |
---|---|---|
Source current (direct) | Is | The maximum value of the direct current that can flow through the internal diode continuously under specified conditions. |
Source current (pulse) | Isp | The maximum value of the current that can flow in pulses in the internal diode. |
Forward voltage | VSD | The drop in voltage when a forward current has flowed in the internal diode. |
Reverse recovery time | trr | The time required for the reverse recovery current in the internal diode to vanish under specified measurement conditions. |
Reverse recovery charge | Qrr | The amount of charge required for the reverse recovery current in the internal diode to vanish under specified measurement conditions. |
Peak reverse recovery current | Irrm | The value of the peak current during reverse recovery operation of the internal diode under specified measurement conditions. |
・In some cases parameter names, terminology, and symbols may be somewhat different for different manufacturers.
・There are also some differences relating to definitions pertaining to condition settings.
・These differences must be dealt with by confirming the measurement conditions and other matters described in specifications, and understanding the specific details of components.