2021.05.26
Points of this article
・Thermal resistance data is acquired in conformation with standard specifications; ordinarily the standard specifications are clearly stated as well.
・Among the JEDEC standards, the following are the main two standards relating to heat.
-JESD51 series:Includes nearly all standards relating to heat in packages for ICs and
other components
-JESD15 series:Standardizes thermal resistance models used in simulations
・Environments for measurement of thermal resistance are stipulated in JESD51-2A.
・The boards used to measure thermal resistance are stipulated in JESD51-3/5/7.
From this article, we explain thermal resistance data. We begin with standards and measurements relating to thermal resistance.
JEDEC (the Joint Electron Device Engineering Council) is an industry organization that develops standards in the field of semiconductor components. There are numerous standards that must necessarily be dealt with not only by semiconductor manufacturers, but by others in the field of electronics as well. That measurement methods and conditions must conform to industry standards, regardless of heat issues, is a fundamental principle. It goes without saying that this is because comparisons and pass/fail judgments would not be possible if methods and conditions were not unified.
Among the JEDEC standards, the following are the main two standards relating to heat.
JESD51 series:Includes nearly all standards relating to heat in packages for ICs and other components
JESD15 series:Standardizes thermal resistance models used in simulations
The following describes representative heat-related standards in the JESD51 series.
JESD51 | Summary |
---|---|
JESD51-1 | ETM methods for TJ measurements and transient thermal measurement methods (Dynamic/Static methods) |
JESD51-2A | Natural convection environments (Still Air) for thermal measurements of IC packages |
JESD51-3 | Low thermal conductivity boards for SMP package measurements |
JESD51-4 | Standards for TEG chips for thermal measurements |
JESD51-5 | Test board standards for packages with heat-dissipating components (fins etc.) |
JESD51-6 | Forced convection environments (Moving Air) for thermal measurements of IC packages |
JESD51-7 | High thermal conductivity boards for SMP package measurements |
JESD51-14 | Methods for Rthjc measurement of packages having one-dimensional heat dissipation paths |
Environments for measurement of thermal resistance are stipulated in JESD51-2A. The following is an example of a thermal resistance measurement environment conforming to the JESD51-2A standard.
By placing the object for measurement within an acrylic chamber, securing a still-air state, the effect of airflow in the vicinity is eliminated, and the object for measurement is in a natural cooling state. By always setting the object for measurement in the same position, highly reproducible measurements are ensured.
There are also standards relating to the boards used to measure thermal resistance. Boards generally known as “JEDEC boards” are standardized by JESD51-3/5/7. An example is shown below.
Thermal resistance data is in essence acquired in conformance with these standard specifications. Ordinarily the standard specifications are also explicitly stated.
Downloadable materials, including lecture materials from ROHM-sponsored seminars and a selection guide for DC-DC converters, are now available.
Downloadable materials, including lecture materials from ROHM-sponsored seminars and a selection guide for DC-DC converters, are now available.